• DocumentCode
    2604014
  • Title

    On the progressive breakdown statistical distribution and its voltage acceleration

  • Author

    Wu, Ernest ; Tous, Santi ; Suñé, Jordi

  • Author_Institution
    IBM Microelectron., Essex Junction
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    493
  • Lastpage
    496
  • Abstract
    The statistical distribution of progressive breakdown (PBD) time is found to be lognormal at high values of failure currents in large sample size experiments. A physics-based model captures the main experimental trends. While we confirm that the voltage scaling of PBD time is nicely modelled by a power law, the value of the power-law exponent is reported to depend on the failure current and to take values somewhat smaller than those previously reported for the first breakdown voltage acceleration.
  • Keywords
    electric breakdown; log normal distribution; lognormal distribution; power-law exponent; progressive breakdown time; statistical distribution; voltage acceleration; voltage scaling; Acceleration; Bismuth; Breakdown voltage; Electric breakdown; Microelectronics; Predictive models; Shape; Statistical distributions; Stress; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4418982
  • Filename
    4418982