• DocumentCode
    2604056
  • Title

    Room-Temperature Threshold-Voltage Instabilities in an MOS Integrated Circuit

  • Author

    Reynolds, F.H.

  • Author_Institution
    Post Office Telecommunications Headquarters, Research Department, Dollis Hill, London NW2 7DT, ENGLAND
  • fYear
    1973
  • fDate
    26755
  • Firstpage
    170
  • Lastpage
    176
  • Keywords
    Circuit testing; Current measurement; Dielectrics; Integrated circuit measurements; Integrated circuit reliability; MOS integrated circuits; Stress measurement; Temperature; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1973. 11th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1973.362590
  • Filename
    4207965
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2604056