Title :
Electrostatic Gate Protection using an Arc Gap Device
Author :
Linholm, Loren W. ; Plachy, Richard F.
Author_Institution :
National Security Agency, S234, Ft. George G. Meade, Md. 20755, 301-688-8128
Keywords :
Dielectrics; Diodes; Electrostatics; Impedance; Laboratories; MOS devices; Protection; Resistors; Testing; Voltage;
Conference_Titel :
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1973.362596
