• DocumentCode
    2604136
  • Title

    Electrostatic Gate Protection using an Arc Gap Device

  • Author

    Linholm, Loren W. ; Plachy, Richard F.

  • Author_Institution
    National Security Agency, S234, Ft. George G. Meade, Md. 20755, 301-688-8128
  • fYear
    1973
  • fDate
    26755
  • Firstpage
    198
  • Lastpage
    202
  • Keywords
    Dielectrics; Diodes; Electrostatics; Impedance; Laboratories; MOS devices; Protection; Resistors; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1973. 11th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1973.362596
  • Filename
    4207971