DocumentCode :
2604196
Title :
Migrating TPSs to next generation ATE
Author :
Bergeron, Jay C.
Author_Institution :
Schlumberger Technol., San Jose, CA, USA
fYear :
1990
fDate :
17-21 Sep 1990
Firstpage :
281
Lastpage :
286
Abstract :
The author discusses the problem of how to completely migrate existing TPSs (test program sets) to next-generation ATE (automatic test equipment). Two scenarios are examined-one in which the migration takes place within a vendor´s product line and one in which the choice is made to change vendors. Real industry solutions to these problems based upon Schlumberger´s extensive background in ATE are discussed. The concept of a neutral engineering database is explored, and CADDIF (Computer Aided Design Data Interchange Format) is presented as a concrete example of such a database. CADDIF provides an open architecture and a bridge between simulation and testing that allows the simulator and the ATE to remain independent of each other. CADDIF allows fully independent development of test programs. It enables engineers to use their favorite simulator for development of their own test vectors. fault dictionaries, etc. Through the use of CADDIF as an exchange medium, these data can be moved not only from simulator to tester but between simulators as well. With CADDIF, the simulation of a unit under test can remain independent of the target ATE. CADDIF allows complete test programs to be quickly converted to a form that permits the simulations to be rerun
Keywords :
CAD; automatic test equipment; electronic engineering computing; ATE; CADDIF; Schlumberger; automatic test equipment; fault dictionaries; industry; neutral engineering database; open architecture; test program sets; test vectors; Automatic test equipment; Automatic testing; Bridges; Computational modeling; Computer architecture; Concrete; Data engineering; Databases; Design engineering; Dictionaries;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/AUTEST.1990.111525
Filename :
111525
Link To Document :
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