DocumentCode
2604202
Title
Who Wants Reliable Plastic Semiconductors?
Author
Hakim, E.B. ; Malinowski, G. ; Holevinski, R.
Author_Institution
Semiconductor Devices & Integrated Electronics Technical Area, US Army Electronics Technology and Devices Laboratory (ECOM), Fort Monmouth, N.J. 07703
fYear
1973
fDate
26755
Firstpage
230
Lastpage
235
Abstract
It has been found that a tri-layer metal contact system, consisting of platinum silicide-titanium-platinum-gold, is at least a factor of five better than a comparable aluminum metalized device with respect to humidity. However, all gold metalized devices are not necessarily this good; an example is given. To evaluate bond integrity, a liquid-to-liquid thermal shock is used followed by a high temperature parameter readout. Data is presented from long-tenm life tests which indicate that reliable plastic devices are not adversely effected after five cycles of thermal shock. Also presented is data indicating acceleration factors for salt atmosphere testing of silicone packages. Finally, problems with procurement of reliable plastic encapsulated semiconductors are discussed from a user´s viewpoint.
Keywords
Aluminum; Bonding; Electric shock; Gold; Humidity; Life testing; Plastics; Platinum; Semiconductor device reliability; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1973.362601
Filename
4207976
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