• DocumentCode
    2604202
  • Title

    Who Wants Reliable Plastic Semiconductors?

  • Author

    Hakim, E.B. ; Malinowski, G. ; Holevinski, R.

  • Author_Institution
    Semiconductor Devices & Integrated Electronics Technical Area, US Army Electronics Technology and Devices Laboratory (ECOM), Fort Monmouth, N.J. 07703
  • fYear
    1973
  • fDate
    26755
  • Firstpage
    230
  • Lastpage
    235
  • Abstract
    It has been found that a tri-layer metal contact system, consisting of platinum silicide-titanium-platinum-gold, is at least a factor of five better than a comparable aluminum metalized device with respect to humidity. However, all gold metalized devices are not necessarily this good; an example is given. To evaluate bond integrity, a liquid-to-liquid thermal shock is used followed by a high temperature parameter readout. Data is presented from long-tenm life tests which indicate that reliable plastic devices are not adversely effected after five cycles of thermal shock. Also presented is data indicating acceleration factors for salt atmosphere testing of silicone packages. Finally, problems with procurement of reliable plastic encapsulated semiconductors are discussed from a user´s viewpoint.
  • Keywords
    Aluminum; Bonding; Electric shock; Gold; Humidity; Life testing; Plastics; Platinum; Semiconductor device reliability; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1973. 11th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1973.362601
  • Filename
    4207976