DocumentCode

2604237

Title

Panel synopsis - how (In)adequate is one time testing?

Author

Parekhji, Rubin A.

Author_Institution

Texas Instruments India Pvt. Ltd.

Volume

1

fYear

2003

fDate

Sept. 30 2003-Oct. 3 2003

Firstpage

1279

Lastpage

1279

Keywords

Circuit faults; Circuit synthesis; Circuit testing; Instruments; Life testing; Logic testing; Manufacturing; Mission critical systems; System testing; USA Councils;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

Conference_Location

Washington, DC, USA

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271119

Filename

1271119