Title :
Panel synopsis - how (In)adequate is one time testing?
Author :
Parekhji, Rubin A.
Author_Institution :
Texas Instruments India Pvt. Ltd.
fDate :
Sept. 30 2003-Oct. 3 2003
Keywords :
Circuit faults; Circuit synthesis; Circuit testing; Instruments; Life testing; Logic testing; Manufacturing; Mission critical systems; System testing; USA Councils;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271119
