• DocumentCode
    2604293
  • Title

    Functional fault simulation of VHDL gate level models

  • Author

    Aftabjahani, Seyed Abdollah ; Navabi, Zainalabedin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tehran Univ., Iran
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    18
  • Lastpage
    23
  • Abstract
    A method of fault injection and fault simulation is proposed. A gate level circuit is modified to include logic gates where faults are to be injected. Values assigned to the inputs of the new additions of the circuit have the effect of injecting stuck-at faults at various lines of the original circuit. A functional model is obtained to represent the new altered circuit. This faultable model can be simulated using a standard VHDL simulator. A program for obtaining this model and creating a simulatable VHDL model has been developed. A comparison with other VHDL based fault simulations is given
  • Keywords
    circuit analysis computing; fault diagnosis; hardware description languages; logic gates; logic testing; VHDL gate level models; VHDL simulator; functional fault simulation; functional model; gate level circuit; logic gates; stuck-at fault injection; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Delay; Electrical fault detection; Fault detection; Logic circuits; Logic gates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VHDL International Users' Forum, 1997. Proceedings
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-8186-8180-2
  • Type

    conf

  • DOI
    10.1109/VIUF.1997.623925
  • Filename
    623925