DocumentCode
2604660
Title
Reliability Aspects of Nichrome Fusible Link PROM´s (Progammable Read Only Memories)
Author
Franklin, Paul ; Burgess, David
Author_Institution
Monolithic Memories, Inc., Sunnyvale, California
fYear
1974
fDate
27120
Firstpage
82
Lastpage
86
Abstract
Reliability aspects of nichrome fusible link PROM\´s have been investigated and are defined in the areas of manufacturing, screening, testing and programming. Early mortality failure populations are analyzed and long term life considerations explored, The "grow-back" mechanism, a failure mode involving the relinking of fuses, is characterized and discussed in terms of design, programming, screening, testing and reliability.
Keywords
Breakdown voltage; Circuit testing; Decoding; Electric breakdown; Fuses; PROM; Packaging; Pins; Read only memory; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1974. 12th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1974.362631
Filename
4208009
Link To Document