• DocumentCode
    2604721
  • Title

    Technology Circuit Co-Design for High Performance Logic

  • Author

    Bernstein, Kerry ; Rohrer, Norman J.

  • Author_Institution
    IBM TJ Watson Res. Center, Yorktown Heights
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    643
  • Lastpage
    643
  • Abstract
    Achieving maximum logic performance at minimum power consumption in deeply scaled CMOS technologies requires the cooperative design of technology, circuits, and architecture. The objective of this paper is to examine the interaction of technology and circuits in highly synchronous logic, and the factors which influence the size of the functionality window and the circuit-limited-yield across process and over time. Specific circuit topology as well as generic chip responses will be explored and tied back to underlying idiosyncrasies of the field effect transistor.
  • Keywords
    CMOS logic circuits; MOSFET; integrated circuit design; integrated circuit yield; logic design; network topology; chip responses; circuit topology; circuit-limited-yield; deeply scaled CMOS technologies; field effect transistor; functionality window; high performance logic; highly synchronous logic; technology circuit co-design; CMOS logic circuits; CMOS technology; Circuit topology; Delay; Energy consumption; Logic circuits; Logic design; Logic devices; Microprocessors; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4419022
  • Filename
    4419022