DocumentCode :
2604902
Title :
Constructive pattern generation heuristic for meeting SSO limits
Author :
Baker, Kendrick
Author_Institution :
Raytheon Co., McKinney, TX, USA
Volume :
2
fYear :
2003
fDate :
30 Sept.-2 Oct. 2003
Firstpage :
50
Abstract :
This paper discusses a heuristic for generating a minimal number of true/complement patterns while still meeting simultaneous switching requirements. The algorithm presented herein generates the patterns by construction, as opposed to selecting the patterns from a larger superset of possible patterns. This potentially offers advantages in time and memory, since no information about the superset needs to be stored or analyzed. In addition, the algorithm appears to produce good results, which in this case means small pattern sets while maintaining the same high level of fault coverage offered by other methods.
Keywords :
automatic test pattern generation; boundary scan testing; electronic engineering computing; integrated circuit interconnections; SSO limits; constructive pattern generation heuristic; fault coverage; pattern sets; simultaneous switching requirements; true/complement patterns; Bonding; Inductance; Information analysis; Packaging; Parasitic capacitance; Pins; Switches; Testing; Voltage; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1271194
Filename :
1271194
Link To Document :
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