• DocumentCode
    2604961
  • Title

    Failure Mechanism on Accelerated ac Test for High Voltage Capacitors

  • Author

    Burnham, J. ; Wong, E.

  • Author_Institution
    Components and Materials Laboratories, Equipment Engineering Divisions, Hughes Aircraft Company, Culver City, California
  • fYear
    1974
  • fDate
    27120
  • Firstpage
    223
  • Lastpage
    233
  • Abstract
    A highly accelerated ac life test for high voltage dc capacitors has been developed which is useful for solid dielectric capacitors such as mica paper and high dielectric constant ceramics with low ac losses. The test utilizes the fact that corona intensity on ac is several orders of magnitude higher than on dc. It is shown that the mechanism of failure involves electrochemical erosion for both the mica paper and the ceramic dielectric material. The life times follow a power law with an exponent of 26 for mnica paper and 31 to 100 for the ceramic.
  • Keywords
    Capacitors; Ceramics; Corona; Dielectric losses; Failure analysis; High-K gate dielectrics; Life estimation; Life testing; Solids; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1974. 12th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1974.362650
  • Filename
    4208028