DocumentCode
2604961
Title
Failure Mechanism on Accelerated ac Test for High Voltage Capacitors
Author
Burnham, J. ; Wong, E.
Author_Institution
Components and Materials Laboratories, Equipment Engineering Divisions, Hughes Aircraft Company, Culver City, California
fYear
1974
fDate
27120
Firstpage
223
Lastpage
233
Abstract
A highly accelerated ac life test for high voltage dc capacitors has been developed which is useful for solid dielectric capacitors such as mica paper and high dielectric constant ceramics with low ac losses. The test utilizes the fact that corona intensity on ac is several orders of magnitude higher than on dc. It is shown that the mechanism of failure involves electrochemical erosion for both the mica paper and the ceramic dielectric material. The life times follow a power law with an exponent of 26 for mnica paper and 31 to 100 for the ceramic.
Keywords
Capacitors; Ceramics; Corona; Dielectric losses; Failure analysis; High-K gate dielectrics; Life estimation; Life testing; Solids; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1974. 12th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1974.362650
Filename
4208028
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