DocumentCode
2605072
Title
Evolution of IEEE 1149.1 addressable shadow protocol devices
Author
Josh, Rakesh N. ; Williams, Kenneth L. ; Whetsel, Lee
Author_Institution
Texas Instruments, Inc., Sherman, TX, USA
Volume
2
fYear
2003
fDate
30 Sept.-2 Oct. 2003
Firstpage
160
Abstract
This paper describes an addressable shadow protocol device that is capable of providing connectivity between a backplane resident IEEE 1149.1 test bus master and a plurality of 1149.1 device chains existing on a board or module. The enhanced device provides for improvement in test, emulation, programming, and other applications based on the 1149.1 test bus.
Keywords
IEEE standards; boundary scan testing; protocols; IEEE 1149.1 standard; JTAG; addressable shadow protocol device; backplane; boundary scan architecture; connectivity; enhanced device; integrated circuit devices; serial test bus; test bus; Application specific processors; Backplanes; Circuit testing; Emulation; Instruments; Integrated circuit interconnections; Integrated circuit testing; Logic testing; Protocols; Synchronization;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271206
Filename
1271206
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