• DocumentCode
    2605127
  • Title

    Board test coverage: the value of prediction and how to compare numbers

  • Author

    Rijckaert, Wouter ; De Jong, Frans

  • Author_Institution
    Centre for Ind. Technol., Philips, Eindhoven, Netherlands
  • Volume
    2
  • fYear
    2003
  • fDate
    30 Sept.-2 Oct. 2003
  • Firstpage
    190
  • Abstract
    Test coverage prediction for board-assemblies has an important function in, among others, test engineering, test cost modeling, test strategy definition and product quality estimation. Introducing a method that defines how this coverage is calculated can increase the value of such prediction across the electronics industry. We consider the three aspects to test coverage calculation: fault modeling, coverage per fault and total coverage. An abstraction level for fault categories is introduced, called MPS (material, placement, soldering) that enables us to compare coverage results using different fault models. Additionally, the rule based fault coverage estimation and the weighted coverage calculation are discussed.
  • Keywords
    electronic engineering computing; estimation theory; fault diagnosis; printed circuit testing; MPS; board test coverage; electronics industry; fault categories; fault modeling; fault models; product quality estimation; test cost modeling; test coverage prediction; test engineering; test strategy definition; weighted coverage calculation; Assembly; Circuit faults; Circuit testing; Costs; Electronics industry; Predictive models; Printed circuits; Production; Soldering; Uninterruptible power systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271209
  • Filename
    1271209