DocumentCode
2605127
Title
Board test coverage: the value of prediction and how to compare numbers
Author
Rijckaert, Wouter ; De Jong, Frans
Author_Institution
Centre for Ind. Technol., Philips, Eindhoven, Netherlands
Volume
2
fYear
2003
fDate
30 Sept.-2 Oct. 2003
Firstpage
190
Abstract
Test coverage prediction for board-assemblies has an important function in, among others, test engineering, test cost modeling, test strategy definition and product quality estimation. Introducing a method that defines how this coverage is calculated can increase the value of such prediction across the electronics industry. We consider the three aspects to test coverage calculation: fault modeling, coverage per fault and total coverage. An abstraction level for fault categories is introduced, called MPS (material, placement, soldering) that enables us to compare coverage results using different fault models. Additionally, the rule based fault coverage estimation and the weighted coverage calculation are discussed.
Keywords
electronic engineering computing; estimation theory; fault diagnosis; printed circuit testing; MPS; board test coverage; electronics industry; fault categories; fault modeling; fault models; product quality estimation; test cost modeling; test coverage prediction; test engineering; test strategy definition; weighted coverage calculation; Assembly; Circuit faults; Circuit testing; Costs; Electronics industry; Predictive models; Printed circuits; Production; Soldering; Uninterruptible power systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271209
Filename
1271209
Link To Document