Title :
IEEE P1581: to live or let die?
Author :
De Jong, Frans ; van de Logt, L.
Author_Institution :
Philips Res., Eindhoven, Netherlands
fDate :
30 Sept.-2 Oct. 2003
Abstract :
Since 2001 the IEEE P1581 working group aims to provide a test standard for memories that cannot have boundary scan. Currently this P1581 activity focuses on test access and test circuitry. This paper elaborates on the status of the draft standard. It describes the test circuitry and an economic model for users of P1581 devices is presented. The working group is facing a lack of interest of active participants. Continuation of the P1581 standard is currently under discussion. An introduction to a discussion for the future of P1581 is given.
Keywords :
IEEE standards; integrated circuit testing; memory architecture; test equipment; IEEE P1581; P1581 devices; memories test; test access; test circuitry; test standard; Assembly; Circuit testing; Consumer products; Costs; Delay; Logic; Packaging; Printed circuits; Production; SDRAM;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271210
