Title :
PXI: a solution for board functional test?
Author_Institution :
BAE SYSTEMS
fDate :
30 Sept.-2 Oct. 2003
Keywords :
Application software; Automatic testing; Bridges; Cost function; Design automation; Instruments; Manufacturing automation; Subcontracting; System testing; Time to market;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271211
