DocumentCode
2605174
Title
Selecting PXI architecture for board (system) functional test
Author
Smitt, Eric L.
Author_Institution
ELS Designs
Volume
2
fYear
2003
fDate
30 Sept.-2 Oct. 2003
Firstpage
207
Lastpage
207
Keywords
Current measurement; Electrical resistance measurement; Hardware; Instruments; Investments; Performance evaluation; Pulse measurements; Switches; System testing; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271212
Filename
1271212
Link To Document