Title :
Micromanipulation based on AFM: Probe tip selection
Author :
Du, Shaorong ; Li, Yangmin
Author_Institution :
Dept. of Electromech. Eng., Univ. of Macau, Macao
Abstract :
Micromanipulation based on AFM (atomic force microscope) has become popular in recent years. Since the AFM probe tip can have several shapes, how to select tip shape is discussed for micromanipulation in this paper. Based on the Hamaker hypotheses and the Lennard-Jones potential, interactions between probe and substrate surface are analyzed for three typical shape probe tips, namely, quadrilateral pyramid, cone, and paraboloid. Simulations are presented, and conclusion is obtained: a quadrilateral pyramid probe tip with small inclination between edge and axis is the best choice for micromanipulation based on AFM.
Keywords :
Lennard-Jones potential; atomic force microscopy; micromanipulators; AFM; Hamaker hypotheses; Lennard-Jones potential; atomic force microscope; cone probe tips; micromanipulation; paraboloid probe tips; quadrilateral pyramid probe tips; Atomic force microscopy; Atomic measurements; Diodes; Force measurement; Force sensors; Probes; Resonance; Resonant frequency; Shape; Surface topography; AFM; Micromanipulation; quadrilateral pyramid probe tip;
Conference_Titel :
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-0607-4
Electronic_ISBN :
978-1-4244-0608-1
DOI :
10.1109/NANO.2007.4601242
