Micromanipulation based on AFM: Probe tip selection

Author

Du, Shaorong ; Li, Yangmin

Author_Institution

Dept. of Electromech. Eng., Univ. of Macau, Macao

fYear

2007

fDate

2-5 Aug. 2007

Firstpage

506

Lastpage

510

Abstract

Micromanipulation based on AFM (atomic force microscope) has become popular in recent years. Since the AFM probe tip can have several shapes, how to select tip shape is discussed for micromanipulation in this paper. Based on the Hamaker hypotheses and the Lennard-Jones potential, interactions between probe and substrate surface are analyzed for three typical shape probe tips, namely, quadrilateral pyramid, cone, and paraboloid. Simulations are presented, and conclusion is obtained: a quadrilateral pyramid probe tip with small inclination between edge and axis is the best choice for micromanipulation based on AFM.

Keywords

Lennard-Jones potential; atomic force microscopy; micromanipulators; AFM; Hamaker hypotheses; Lennard-Jones potential; atomic force microscope; cone probe tips; micromanipulation; paraboloid probe tips; quadrilateral pyramid probe tips; Atomic force microscopy; Atomic measurements; Diodes; Force measurement; Force sensors; Probes; Resonance; Resonant frequency; Shape; Surface topography; AFM; Micromanipulation; quadrilateral pyramid probe tip;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on

Conference_Location

Hong Kong

Print_ISBN

978-1-4244-0607-4

Electronic_ISBN

978-1-4244-0608-1

Type

conf

DOI

10.1109/NANO.2007.4601242

Filename

4601242