Title :
Modeling & Simulation - Nanotubes, Nanowires, and Nanoribbons
Author :
Iannaccone, Giuseppe ; Sano, Nobuyuki
Author_Institution :
University of Pisa
Keywords :
Analytical models; Carbon nanotubes; Electrostatic analysis; Leakage current; MOSFETs; Nanoscale devices; Nanowires; Parasitic capacitance; Schottky diodes; Silicon;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4419050
