Title :
Standards based wireless device testing
Author_Institution :
Rohde & Schwarz
fDate :
30 Sept.-2 Oct. 2003
Keywords :
Error correction; Hardware; History; Licenses; Manufacturing; Production; Radio frequency; Software testing; Standards development; Telephony;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271217
