• DocumentCode
    2605307
  • Title

    Board life-cycle testing for effective npi management of wireless products

  • Author

    Piironen, Timo

  • Author_Institution
    Elektrobit Oy Oulu
  • Volume
    2
  • fYear
    2003
  • fDate
    30 Sept.-2 Oct. 2003
  • Firstpage
    215
  • Lastpage
    215
  • Keywords
    Automatic testing; Built-in self-test; Design for testability; Instruments; Life testing; Manufacturing; Production systems; Radio frequency; Research and development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271220
  • Filename
    1271220