• DocumentCode
    2605359
  • Title

    Performance Comparison of Graphene Nanoribbon Schottky Barrier and MOS FETs

  • Author

    Fiori, G. ; Yoon, Youngki ; Hong, Seokmin ; Iannaccone, Giuseppe ; Guo, Jing

  • Author_Institution
    Univ. di Pisa, Pisa
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    757
  • Lastpage
    760
  • Abstract
    Graphene nanoribbon (GNR) Schottky barrier (SB) FETs and MOSFETs are studied using self-consistent atomistic simulations. MOSFETs show 30-70% performance improvement in terms of larger on current, larger maximum achievable on-off current ratio, larger cutoff frequency, smaller intrinsic delay and better saturation behavior for ideal structures. Disorders, such as lattice vacancies, edge roughness, and ionized impurities, have a significant impact on device performance and variability, due to strong sensitivity to electrostatic environment and channel atomistic structure.
  • Keywords
    MOSFET; Schottky barriers; GNR; MOSFET; SB; Schottky barrier; channel atomistic structure; electrostatic environment; graphene nanoribbon; Cutoff frequency; Delay; FETs; Impurities; Lattices; MOSFETs; Poisson equations; Schottky barriers; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4419057
  • Filename
    4419057