DocumentCode
2605740
Title
Reliability Study of GaAs, 63P.37 LED´S
Author
Pommer, Karl
Author_Institution
McDonnell Douglas Astronautics Company - East, St. Louis, Missouri 63166
fYear
1975
fDate
27485
Firstpage
200
Lastpage
206
Abstract
A comprehensive study of the long life and reliability characteristics of a hermetically sealed GaAsP LED has been performed using accelerated life test techniques. A degradation model was developed based on the Arrhenius equation which was found to describe a lognormal failure distribution. The Extended-Longini failure mechanism was expanded to include the effects of crystalline dislocations.
Keywords
Crystallization; Degradation; Equations; Failure analysis; Gallium arsenide; Hermetic seals; Life estimation; Life testing; Light emitting diodes; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1975. 13th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1975.362695
Filename
4208076
Link To Document