• DocumentCode
    2605787
  • Title

    Blue electroluminescence from metal/oxide/6H-SiC tunneling diodes

  • Author

    Jan, S.-R. ; Cheng, T.-H. ; Liao, M.H. ; Hung, T.-A. ; Deng, Y. ; Liu, C.W.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • fYear
    2007
  • fDate
    2-5 Aug. 2007
  • Firstpage
    674
  • Lastpage
    677
  • Abstract
    Pt/oxide/n-6H-SiC tunneling diode has been fabricated using liquid phase deposited oxide as the tunneling oxide. At the negative bias, the electrons can be injected from the Pt gate to n-SiC, and recombine radiatively with the trapped holes in the defects near the oxide/SiC interface. The electroluminescence at room temperature from the SiC MOS tunneling diodes is observed for the first time. The light intensity decrease with the decreasing temperature. At the positive bias, the electron tunneling current from SiC to Pt gate is dominant, and the radiative recombination in SiC is not observed.
  • Keywords
    MIS devices; electroluminescent devices; liquid phase deposition; platinum; silicon compounds; tunnel diodes; wide band gap semiconductors; Pt-SiC:H; blue electroluminescence; electron tunneling current; liquid phase deposited oxide; metal-oxide-6H-silicon oxide tunneling diodes; oxide-silicon carbide interface; positive bias; radiative recombination; temperature 293 K to 298 K; trapped holes; tunneling oxide; Electroluminescence; Light emitting diodes; Luminescence; Nitrogen; Photonic band gap; Plasma temperature; Radiative recombination; Silicon carbide; Spontaneous emission; Tunneling; MOS; Pt; SiC; luminescence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-0607-4
  • Electronic_ISBN
    978-1-4244-0608-1
  • Type

    conf

  • DOI
    10.1109/NANO.2007.4601279
  • Filename
    4601279