DocumentCode
2605787
Title
Blue electroluminescence from metal/oxide/6H-SiC tunneling diodes
Author
Jan, S.-R. ; Cheng, T.-H. ; Liao, M.H. ; Hung, T.-A. ; Deng, Y. ; Liu, C.W.
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
fYear
2007
fDate
2-5 Aug. 2007
Firstpage
674
Lastpage
677
Abstract
Pt/oxide/n-6H-SiC tunneling diode has been fabricated using liquid phase deposited oxide as the tunneling oxide. At the negative bias, the electrons can be injected from the Pt gate to n-SiC, and recombine radiatively with the trapped holes in the defects near the oxide/SiC interface. The electroluminescence at room temperature from the SiC MOS tunneling diodes is observed for the first time. The light intensity decrease with the decreasing temperature. At the positive bias, the electron tunneling current from SiC to Pt gate is dominant, and the radiative recombination in SiC is not observed.
Keywords
MIS devices; electroluminescent devices; liquid phase deposition; platinum; silicon compounds; tunnel diodes; wide band gap semiconductors; Pt-SiC:H; blue electroluminescence; electron tunneling current; liquid phase deposited oxide; metal-oxide-6H-silicon oxide tunneling diodes; oxide-silicon carbide interface; positive bias; radiative recombination; temperature 293 K to 298 K; trapped holes; tunneling oxide; Electroluminescence; Light emitting diodes; Luminescence; Nitrogen; Photonic band gap; Plasma temperature; Radiative recombination; Silicon carbide; Spontaneous emission; Tunneling; MOS; Pt; SiC; luminescence;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-0607-4
Electronic_ISBN
978-1-4244-0608-1
Type
conf
DOI
10.1109/NANO.2007.4601279
Filename
4601279
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