DocumentCode
2605819
Title
Packages and Film Resistors for Hybrid Microcircuits
Author
Lane, Clyde H.
Author_Institution
Rome Air Development Center, Griffiss AFB NY 13441
fYear
1975
fDate
27485
Firstpage
230
Lastpage
241
Abstract
Resistors: A review of resistor systems, and the processes used to deposit and delineate them, is given. Effects of mechanical, thermal, chemical and electrical stresses are discussed as they relate to accuracy and stability. Failure mechanisms are reviewed. Triming techniques are explored and design limits for the various systems discussed. Parameters of interest such as frequency response, temperature coefficient, voltage coefficient and noise are compared for the various systems. Finally, quality control and screening techniques are discussed as they relate failure mechanisms and package quality and reliability control.
Keywords
Chemicals; Failure analysis; Frequency response; Hybrid integrated circuits; Packaging; Resistors; Temperature; Thermal stability; Thermal stresses; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1975. 13th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1975.362700
Filename
4208081
Link To Document