• DocumentCode
    2605819
  • Title

    Packages and Film Resistors for Hybrid Microcircuits

  • Author

    Lane, Clyde H.

  • Author_Institution
    Rome Air Development Center, Griffiss AFB NY 13441
  • fYear
    1975
  • fDate
    27485
  • Firstpage
    230
  • Lastpage
    241
  • Abstract
    Resistors: A review of resistor systems, and the processes used to deposit and delineate them, is given. Effects of mechanical, thermal, chemical and electrical stresses are discussed as they relate to accuracy and stability. Failure mechanisms are reviewed. Triming techniques are explored and design limits for the various systems discussed. Parameters of interest such as frequency response, temperature coefficient, voltage coefficient and noise are compared for the various systems. Finally, quality control and screening techniques are discussed as they relate failure mechanisms and package quality and reliability control.
  • Keywords
    Chemicals; Failure analysis; Frequency response; Hybrid integrated circuits; Packaging; Resistors; Temperature; Thermal stability; Thermal stresses; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1975. 13th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1975.362700
  • Filename
    4208081