DocumentCode

2605827

Title

Repairs to Complex Hybrid Circuits - Their Effect on Reliability

Author

Bertin, A.P. ; Terwilliger, T.W.

Author_Institution

General Electric Company, Aircraft Equipment Division, Utica, New York

fYear

1975

fDate

27485

Firstpage

242

Lastpage

247

Keywords

Assembly; Bonding; Circuit optimization; Circuit testing; History; Seals; Substrates; Temperature; Thin film circuits; Thin film transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1975. 13th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1975.362701

Filename

4208082