DocumentCode

2605892

Title

Practical Uses of Accelerated Testing at Motorola

Author

Lycoudes, Nicholas

Author_Institution

Bipolar I/C Reliability Engineering, Motorola Semiconductor Products Division, 5005 E. McDowell Rd., Phoenix, Arizona 85008

fYear

1975

fDate

27485

Firstpage

257

Lastpage

259

Keywords

Aluminum; Circuit testing; Corrosion; Humidity; Integrated circuit reliability; Integrated circuit testing; Life estimation; Life testing; Plastics; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1975. 13th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1975.362705

Filename

4208086