DocumentCode
2605908
Title
From design for test to concurrent engineering
Author
Turino, Jon
Author_Institution
Logical Solutions Technol. Inc., Campbell, CA, USA
fYear
1990
fDate
17-21 Sep 1990
Firstpage
345
Lastpage
349
Abstract
It is argued that design for testability will not be enough by itself in the 1990s and that the entire design philosophy must change from a serial approach to a parallel one of concurrent engineering. An outline of previous approaches is presented, exploring what has and has not worked and what is still not working. The author identifies the fundamental changes that must occur in systems engineering and the impact that design for testability, design for quality, design for manufacturability, and design for serviceability will have on the acceptance by the services of new systems designs. The concurrent engineering environment and some of the computer-aided engineering tools needed to successfully implement it are described. Some examples of the impact concurrent engineering on development times, production costs, and overall life-cycle costs are examined
Keywords
CAD/CAM; automatic testing; economics; electronic engineering computing; electronic equipment testing; CAD; CAM; concurrent engineering; design for manufacturability; design for quality; design for serviceability; design for testability; electronics industry; life-cycle costs; production costs; systems engineering; testability; Concurrent computing; Concurrent engineering; Costs; Design engineering; Design for quality; Design for testability; Manufacturing; Production; Systems engineering and theory; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location
San Antonio, TX
Type
conf
DOI
10.1109/AUTEST.1990.111534
Filename
111534
Link To Document