• DocumentCode
    2605908
  • Title

    From design for test to concurrent engineering

  • Author

    Turino, Jon

  • Author_Institution
    Logical Solutions Technol. Inc., Campbell, CA, USA
  • fYear
    1990
  • fDate
    17-21 Sep 1990
  • Firstpage
    345
  • Lastpage
    349
  • Abstract
    It is argued that design for testability will not be enough by itself in the 1990s and that the entire design philosophy must change from a serial approach to a parallel one of concurrent engineering. An outline of previous approaches is presented, exploring what has and has not worked and what is still not working. The author identifies the fundamental changes that must occur in systems engineering and the impact that design for testability, design for quality, design for manufacturability, and design for serviceability will have on the acceptance by the services of new systems designs. The concurrent engineering environment and some of the computer-aided engineering tools needed to successfully implement it are described. Some examples of the impact concurrent engineering on development times, production costs, and overall life-cycle costs are examined
  • Keywords
    CAD/CAM; automatic testing; economics; electronic engineering computing; electronic equipment testing; CAD; CAM; concurrent engineering; design for manufacturability; design for quality; design for serviceability; design for testability; electronics industry; life-cycle costs; production costs; systems engineering; testability; Concurrent computing; Concurrent engineering; Costs; Design engineering; Design for quality; Design for testability; Manufacturing; Production; Systems engineering and theory; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
  • Conference_Location
    San Antonio, TX
  • Type

    conf

  • DOI
    10.1109/AUTEST.1990.111534
  • Filename
    111534