Determination of Useful Life of Two-Layer Metallization Systems Via Accelerated Stressing

Author

VanVonno, N.W.

Author_Institution

Lead Engineer, Harris Semiconductor, P. O. Box 883, Melbourne, Florida 32901

fYear

1975

fDate

27485

Firstpage

263

Lastpage

265

Keywords

Acceleration; Aluminum; Contacts; Electromigration; Failure analysis; Life estimation; Metallization; Stress; Testing; Vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1975. 13th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

DOI

10.1109/IRPS.1975.362707

Filename

4208088

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