• DocumentCode
    2606286
  • Title

    Current Capabilities and Future Prospects of Atomistic Process Simulation

  • Author

    Jaraiz, M. ; Castrillo, P. ; Pinacho, R. ; Rubio, J.E.

  • Author_Institution
    Univ. of Valladolid, Valladolid
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    951
  • Lastpage
    954
  • Abstract
    Atomistic process simulators, based on the Kinetic Monte Carlo (KMC) scheme, are an attempt to fulfill some of the ITRS expectations for process modeling and simulation. We present a general overview of its conception and evolution up to its current state, show some of the latest developments, and discuss the possible trends in atomistic process simulation for the coming years.
  • Keywords
    MOSFET; Monte Carlo methods; semiconductor process modelling; ITRS; atomistic process simulation; high-performance MOSFET devices; kinetic Monte Carlo scheme; process modeling; Atomic layer deposition; CMOS process; Fluctuations; Impurities; Kinetic theory; MOSFET circuits; Manufacturing processes; Monte Carlo methods; Predictive models; Simulated annealing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4419110
  • Filename
    4419110