DocumentCode
2606349
Title
A Study of Dielectric Absorption in Capacitors by Thermally Stimulated Discharge (TSD) Tests
Author
Burnham, J. ; Webster, S.L. ; Simmons, W.J. ; Borough, J.W.
Author_Institution
Hughes Aircraft Company, Culver City, California 90232
fYear
1976
fDate
27851
Firstpage
147
Lastpage
156
Abstract
The dielectric absorption (DA) of capacitors with various dielectrics has been studied by the use of Thermally Stimulated Discharge (TSD). It has been shown that this test gives a much more accurate measurement of DA and in addition gives information about the mechanism of absorption. The charge determined by TSD has been correlated with noise which reduces the reliability of the capacitors in high gain circuits.
Keywords
Absorption; Capacitors; Charge measurement; Circuit testing; Current measurement; Dielectric measurements; History; Temperature distribution; Time measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1976. 14th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1976.362735
Filename
4208119
Link To Document