DocumentCode
2606358
Title
Process Technology - Interconnect & 3D-IC´s
Author
Iacoponi, John ; Hasegawa, Toshiaki
Author_Institution
AMD
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
967
Lastpage
967
Keywords
Copper; Costs; Dielectrics; Hafnium oxide; MIM capacitors; Microassembly; National electric code; Packaging; Paper technology; Three-dimensional integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-1507-6
Electronic_ISBN
978-1-4244-1508-3
Type
conf
DOI
10.1109/IEDM.2007.4419114
Filename
4419114
Link To Document