DocumentCode :
2606502
Title :
Blind Image Steganalysis Based on Statistical Analysis of Empirical Matrix
Author :
Chen, Xiaochuan ; Wang, Yunhong ; Tan, Tieniu ; Guo, Lei
Author_Institution :
Inst. of Autom., Chinese Acad. of Sci., Beijing
Volume :
3
fYear :
0
fDate :
0-0 0
Firstpage :
1107
Lastpage :
1110
Abstract :
In this paper, a novel steganalysis method based on statistical analysis of empirical matrix (EM) is proposed to detect the presence of hidden message in an image. The projection histogram (PH) of EM is used to extract features composed of two parts: the moments of PH and the moments of the characteristic function of PH. Also, features extracted from prediction-error image by Yun Q. Shi et al, (2005) are included to enhance performance. SVM is utilized as classifier. A test database is constructed, based on which a detailed test for different categories of features and a comparison with methods in prior arts are conducted. Experiments show that the features we proposed are more effective than prior arts and our steganalysis method could blindly detect the presence of data hiding for various embedding schemes with high performance
Keywords :
cryptography; data encapsulation; feature extraction; image classification; statistical analysis; support vector machines; SVM; blind image steganalysis; empirical matrix; feature extraction; hidden message; prediction-error image; projection histogram; statistical analysis; Art; Data encapsulation; Feature extraction; Histograms; Image databases; Spatial databases; Statistical analysis; Support vector machine classification; Support vector machines; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
Conference_Location :
Hong Kong
ISSN :
1051-4651
Print_ISBN :
0-7695-2521-0
Type :
conf
DOI :
10.1109/ICPR.2006.332
Filename :
1699719
Link To Document :
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