DocumentCode
2606534
Title
Thermally Stimulated Discharge Effects in Polymer Encapsulants
Author
Woodard, J.B.
Author_Institution
Hysol Division, Dexter Corporation, Olean, New York
fYear
1976
fDate
27851
Firstpage
234
Lastpage
239
Abstract
Regions of polymer encapsulant formulations are frequently exposed to high temperatures and high electric field strengths when used in encapsulation of semiconductor devices. The technique of thermally stimulated discharge is used to study effects of these polarizing fields on various epoxy compounds. The dependence of the unique discharge curve shapes found for these systems on chemical composition is noted. New methods of analysis are presented. Desirable polarization properties for an epoxy encapsulant are defined, and an approach to the development of systems exhibiting these desirable properties is outlined.
Keywords
Chemicals; Dielectric measurements; Electrets; Encapsulation; Life estimation; Polarization; Polymers; Semiconductor devices; Temperature distribution; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1976. 14th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1976.362748
Filename
4208132
Link To Document