• DocumentCode
    2606534
  • Title

    Thermally Stimulated Discharge Effects in Polymer Encapsulants

  • Author

    Woodard, J.B.

  • Author_Institution
    Hysol Division, Dexter Corporation, Olean, New York
  • fYear
    1976
  • fDate
    27851
  • Firstpage
    234
  • Lastpage
    239
  • Abstract
    Regions of polymer encapsulant formulations are frequently exposed to high temperatures and high electric field strengths when used in encapsulation of semiconductor devices. The technique of thermally stimulated discharge is used to study effects of these polarizing fields on various epoxy compounds. The dependence of the unique discharge curve shapes found for these systems on chemical composition is noted. New methods of analysis are presented. Desirable polarization properties for an epoxy encapsulant are defined, and an approach to the development of systems exhibiting these desirable properties is outlined.
  • Keywords
    Chemicals; Dielectric measurements; Electrets; Encapsulation; Life estimation; Polarization; Polymers; Semiconductor devices; Temperature distribution; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1976. 14th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1976.362748
  • Filename
    4208132