DocumentCode
2606922
Title
A priori error estimation of magnetic material characteristics using stochastic uncertainty analysis
Author
Abdallh, Ahmed Abou-Elyazied ; Crevecoeur, Guillaume ; Dupré, Luc
Author_Institution
Dept. of Electr. Energy, Syst. & Autom., Ghent Univ., Ghent, Belgium
fYear
2010
fDate
9-12 May 2010
Firstpage
1
Lastpage
1
Abstract
By interpreting electromagnetic or mechanical measurements with a numerical model of the considered electromagnetic device, magnetic properties of the magnetic circuit of that device can be estimated by solving an inverse numerical electromagnetic problem. Due to measurement noise and uncertainties in the forward model, errors are made in the reconstruction of the material properties. This paper describes the formulation and implementation of the error estimation and the prediction of which measurements that need to be carried out for accurate magnetic material characterization. Stochastic uncertainty analysis, based on Cramér-Rao bound (CRB), is introduced and applied to the magnetic material characterization of a Switched Reluctance Motor (SRM) starting from mechanical (torque) and local magnetic measurements. The traditional CRB method that estimates the error due to measurement noise is extended with the incorporation of stochastic uncertain geometrical model parameters.
Keywords
electromagnetic devices; error statistics; magnetic circuits; magnetic materials; reluctance motors; stochastic processes; torque measurement; Cramer-Rao bound; Switched Reluctance Motor; electromagnetic device; electromagnetic measurements; error estimation; inverse numerical electromagnetic problem; local magnetic measurements; magnetic circuit; magnetic material characteristics; magnetic material characterization; magnetic properties; measurement noise; mechanical measurements; mechanical torque measurements; numerical model; stochastic uncertainty analysis; Electromagnetic devices; Electromagnetic measurements; Error analysis; Magnetic analysis; Magnetic materials; Magnetic noise; Noise measurement; Stochastic processes; Stochastic resonance; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Field Computation (CEFC), 2010 14th Biennial IEEE Conference on
Conference_Location
Chicago, IL
Print_ISBN
978-1-4244-7059-4
Type
conf
DOI
10.1109/CEFC.2010.5481288
Filename
5481288
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