DocumentCode :
2607014
Title :
START: System Testability Analysis and Research Tool
Author :
Pattipati, Krishna R. ; Deb, Somnath ; Dontamsetty, Mahesh ; Maitra, Amit
Author_Institution :
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
fYear :
1990
fDate :
17-21 Sep 1990
Firstpage :
395
Lastpage :
402
Abstract :
A brief overview of the Systems Testability Analysis and Research Tool (START) software package for automatic test sequencing and testability analysis of complex hierarchically described modular systems is presented. It consists of algorithms based on information theory, heuristic search, and graph theory to solve various facets of the test sequencing and testability analysis problems. A system is modeled in the failure space as a hierarchical directed graph with nodes denoting modules and test points and AND nodes denoting redundancy. Interconnections among the nodes denote their immediate functional dependencies. START supports hierarchical testing in accordance with the maintenance strategy; a failure source may be isolated to a component or a module at any level, e.g. LRU (line replaceable unit), SRU (shop replaceable unit), etc. Other practical features include options to integrate diagnosis with repair (after partial diagnosis) and to optimize test time, test cost, or test and repair cost. An interactive menu-mouse graphical interface serves as a high-level front end to these algorithms and enables the user to graphically enter and modify hierarchical functional models of systems
Keywords :
automatic test equipment; automatic testing; graphical user interfaces; hierarchical systems; interactive systems; maintenance engineering; redundancy; software packages; AND nodes; START; Systems Testability Analysis and Research Tool; automatic test sequencing; complex hierarchically described modular systems; diagnosis; graph theory; heuristic search; hierarchical directed graph; hierarchical testing; information theory; interactive menu-mouse graphical interface; line replaceable unit; maintenance strategy; redundancy; repair; shop replaceable unit; software package; test cost; test time; testability analysis; Algorithm design and analysis; Automatic testing; Circuit faults; Circuit testing; Cost function; Production facilities; Software packages; Software testing; System testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/AUTEST.1990.111540
Filename :
111540
Link To Document :
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