DocumentCode
2607014
Title
START: System Testability Analysis and Research Tool
Author
Pattipati, Krishna R. ; Deb, Somnath ; Dontamsetty, Mahesh ; Maitra, Amit
Author_Institution
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
fYear
1990
fDate
17-21 Sep 1990
Firstpage
395
Lastpage
402
Abstract
A brief overview of the Systems Testability Analysis and Research Tool (START) software package for automatic test sequencing and testability analysis of complex hierarchically described modular systems is presented. It consists of algorithms based on information theory, heuristic search, and graph theory to solve various facets of the test sequencing and testability analysis problems. A system is modeled in the failure space as a hierarchical directed graph with nodes denoting modules and test points and AND nodes denoting redundancy. Interconnections among the nodes denote their immediate functional dependencies. START supports hierarchical testing in accordance with the maintenance strategy; a failure source may be isolated to a component or a module at any level, e.g. LRU (line replaceable unit), SRU (shop replaceable unit), etc. Other practical features include options to integrate diagnosis with repair (after partial diagnosis) and to optimize test time, test cost, or test and repair cost. An interactive menu-mouse graphical interface serves as a high-level front end to these algorithms and enables the user to graphically enter and modify hierarchical functional models of systems
Keywords
automatic test equipment; automatic testing; graphical user interfaces; hierarchical systems; interactive systems; maintenance engineering; redundancy; software packages; AND nodes; START; Systems Testability Analysis and Research Tool; automatic test sequencing; complex hierarchically described modular systems; diagnosis; graph theory; heuristic search; hierarchical directed graph; hierarchical testing; information theory; interactive menu-mouse graphical interface; line replaceable unit; maintenance strategy; redundancy; repair; shop replaceable unit; software package; test cost; test time; testability analysis; Algorithm design and analysis; Automatic testing; Circuit faults; Circuit testing; Cost function; Production facilities; Software packages; Software testing; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location
San Antonio, TX
Type
conf
DOI
10.1109/AUTEST.1990.111540
Filename
111540
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