• DocumentCode
    2607019
  • Title

    Testing and Modeling of Low Current Arc in Free Air

  • Author

    Yan, Xianglian ; Wang, Chengyu ; Chen, Weijiang

  • Author_Institution
    China Electr. Power Res. Inst., Beijing
  • fYear
    2008
  • fDate
    9-12 Nov. 2008
  • Firstpage
    136
  • Lastpage
    139
  • Abstract
    As single-phase-earth fault occurred in low current earthed system, arc self-extinguishing characteristics caused by the short-circuit currents influence the safety and the reliability of Grid working. A simulated test circuit is adopted in the paper, to discuss arcing characteristics on low current system by abundant tests. Based on these achieved test data, taking the movement of long AC arc into account to get arc factual length, an arc dynamic conductance model at low current is setup, promoting the equivalent circuit and arc self-extinction criterion of arc model. Single-phase-earth arcing fault on 10 kV distribution network is computed and analyzed as an example by the simulation program, those results, as arc length, arc waveforms and arc duration times, conform test phenomenon. With the studies, arc self-extinction mechanism at low current in free air has been completed further to expose the physical nature of air arc, and proposing a practical arc model to guide the engineering application.
  • Keywords
    arcs (electric); earthing; power distribution protection; power distribution reliability; short-circuit currents; arc duration times; arc dynamic conductance; arc factual length; arc self-extinguishing characteristics; arc waveforms; distribution network; low current arc; low current earthed system; short-circuit currents; single-phase-earth arcing fault; voltage 10 kV; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer networks; Distributed computing; Equivalent circuits; Safety; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-3823-5
  • Electronic_ISBN
    978-1-4244-2810-6
  • Type

    conf

  • DOI
    10.1109/ICHVE.2008.4773892
  • Filename
    4773892