Properties of CuPc/Se organics-inorganic hybrid thin films growth by electron beam evaporation technique

Organic and Inorganic materials with copper (II) phthalocyanine (CuPc) and selenium (Se) were deposited to implement hybrid thin films by multi pocket electron beam evaporation technique. Crystallization of hybrid films was performed by X-ray diffraction (XRD) spectroscopy. XRD pattern exhibits monoclinic alpha-phase crystallizations structure of CuPc. Influences of the CuPc thickness on the crystalline structure of selenium films were obtained. As the thickness of CuPc layer was increased to 100 nm, the hexagonal Se was observed. Optical absorption spectra were measured by UV-Visible spectrophotometer. Results of hybrid absorption spectra were revealed to absorption spectra of CuPc and Se. Surface roughness of films can confirm with XRD spectra. The surface morphology was characterized by atomic force microscope (AFM) with non-contact mode, it illustrate the point that hybrid thin films is nanocrystal structure.