• DocumentCode
    2607144
  • Title

    Low-noise optimisation of current-mode transimpedance optical preamplifiers

  • Author

    Vanisri, Tongtod ; Toumazou, Chris

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
  • fYear
    1993
  • fDate
    3-6 May 1993
  • Firstpage
    966
  • Abstract
    Techniques for minimizing the noise performance of current-mode common-gate and common-base optical transimpedance preamplifiers are presented. For common-gate input preamplifiers, it is shown that the size of the input FETs can be chosen to achieve the minimum possible noise performance. Both theoretical analysis and simulated results using 30-GHz GaAs MESFET technology confirm the concept. Modified simpler designs for both common-gate and common-base similar low-noise properties are described. Simulated results using GaAs heterojunction bipolar transistor (HBT) and MESFET technology demonstrate that almost 2 dB lower electrical noise performance (compared with classical voltage-mode designs at a 10 GHz bandwidth) can be obtained with the new topologies. In both cases, the transimpedance gain is at least a factor of 4 higher than that obtained with classical counterparts. Preliminary measured results of the GaAs HBT preamplifier are presented
  • Keywords
    III-V semiconductors; MESFET integrated circuits; bipolar analogue integrated circuits; circuit optimisation; gallium arsenide; integrated circuit noise; optical receivers; p-i-n photodiodes; preamplifiers; 30 GHz; GaAs; GaAs MESFET technology; common-base configuration; common-gate configurations; current-mode transimpedance optical preamplifiers; heterojunction bipolar transistor; input FETs; noise performance; transimpedance gain; Analytical models; Bandwidth; FETs; Gallium arsenide; Heterojunction bipolar transistors; MESFETs; Optical noise; Preamplifiers; Topology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • DOI
    10.1109/ISCAS.1993.393884
  • Filename
    393884