DocumentCode :
2607201
Title :
Screening Results of JAN Transistors and Diodes Used in Military and Aerospace Programs
Author :
Scheffel, Paul E.
Author_Institution :
DCA Reliability Laboratory, Sunnyvale, California 94086. (408) 245-7100
fYear :
1977
fDate :
28216
Firstpage :
163
Lastpage :
165
Keywords :
Aerospace electronics; Aerospace engineering; Aerospace testing; Data engineering; Diodes; Inspection; Manufacturing; NASA; Procurement; Space shuttles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1977. 15th Annual
Conference_Location :
LAs Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1977.362789
Filename :
4208176
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2607201
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