DocumentCode
2607221
Title
Effect of processing parameters on the morphology of the interfacial intermetallics between Cu and SnPb solders
Author
Hariram, Kithva Prakash ; Pang, John H L
Author_Institution
Sch. of Mech. & Production Eng., Nanyang Technol. Univ., Singapore
fYear
2003
fDate
10-12 Dec. 2003
Firstpage
204
Lastpage
209
Abstract
The wetting reaction between Cu substrate and the molten Sn-Pb solder alloys of four different compositions had been studied to characterise the morphology of the intermetallic compound (IMC) at the interface between Cu and solder. The morphological changes of the IMC layer is analysed with respect to the Pb-content of the solder alloy, molten solder temperature (10°C, 20°C, 40°C and 60°C above the liquidus temperature of each alloy) and immersion time of Cu. The morphology of the IMC is classified into three broad groups namely, cellular, scallop and planar. These morphologies are found to vary gradually from one type to the other with the Pb-content, temperature and time. Fractal Dimension (FD), a measure of roughness, is estimated from the digitized SEM micrographs of the IMC layer at each reaction condition and it is correlated with reaction conditions.
Keywords
copper; fractals; interface roughness; lead alloys; scanning electron microscopy; solders; tin alloys; wetting; 10 to 60 C; Cu; SnPb; copper substrate; fractal dimension; interface roughness; interfacial intermetallics morphology; liquidus temperature; molten solder alloys; molten solder temperature; processing parameters; wetting reaction; Copper alloys; Fractals; Intermetallic; Rough surfaces; Soldering; Surface cracks; Surface morphology; Surface resistance; Surface roughness; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
Print_ISBN
0-7803-8205-6
Type
conf
DOI
10.1109/EPTC.2003.1271517
Filename
1271517
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