• DocumentCode
    2607247
  • Title

    Reliability Evaluation of ECL Integrated Circuits

  • Author

    Bartels, D. ; Capobianco, A. ; Lasch, K.B. ; Lynch, K.S.

  • Author_Institution
    Raytheon Company, Hartwell Road, Bedford, Massachusetts 01730
  • fYear
    1977
  • fDate
    28216
  • Firstpage
    196
  • Lastpage
    203
  • Abstract
    An evaluation study has been completed on ECL circuits of various circuit complexities. The study consisted of electrical and physical characterization, step stress and accelerated long term testing, failure analysis and failure rate determination. 575 devices from four different manufacturers were studied. Four failure modes were identified and shown to be caused by electromigration phenomena. The results of this study indicate that the devices evaluated can reliably operate at the military specified ambient temperature of 125°C provided the termination is 100¿ as specified in MIL-M-38510/60. Reliable operation is possible into a 50¿ termination for an ambient temperature of 85°C.
  • Keywords
    Automatic testing; Glass; Integrated circuit interconnections; Integrated circuit reliability; Logic devices; Low voltage; Manufacturing; Metallization; Temperature; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1977. 15th Annual
  • Conference_Location
    LAs Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1977.362792
  • Filename
    4208179
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2607247