• DocumentCode
    2607377
  • Title

    Board level solder joint failures by static and dynamic loads

  • Author

    Tan, L.B. ; Seah, S.K.W. ; Wong, E.H. ; Zhang, Xiaowu ; Tan, V.B.C. ; Lim, C.T.

  • Author_Institution
    Dept. of Mech. Eng., Nat. Univ. of Singapore, Singapore
  • fYear
    2003
  • fDate
    10-12 Dec. 2003
  • Firstpage
    244
  • Lastpage
    251
  • Abstract
    Quasi-static bend tests and drop tests of surface mounted MCMs on printed circuit boards (PCBs) are conducted to compare the failure patterns from the two types of tests. The boards are 120×90 mm in dimension. The modules are 40×40 mm with a brass heat spreader of the same dimension on top. Five-point bend tests are conducted with different ramp-rates from 0.1 to 10.0 mm/min to determine the effect of different PCB strain rates on the reliability of the solder interconnections. Drop tests are conducted for the same batch of PCBs at 1.0 m and 1.5 m drop heights and PCB strains from drop tests are compared with those taken from the quasi-static tests. A failure analysis is also conducted to determine the possible mechanisms of failure. Findings show that solder joint failure in five-point bend tests is dependent on the ramp-rate. The tests also show that mass inertia of the heat-spreader may cause solder joints to fail at lower PCB strain levels than expected especially for packages with heavier heat-spreaders which are needed for higher heat dissipation.
  • Keywords
    bending; circuit reliability; failure analysis; impact testing; interconnections; multichip modules; printed circuit testing; strain measurement; 1.0 m; 1.5 m; 120 mm; 40 mm; 90 mm; PCB drop tests; PCB strain rates; bend test ramp-rate; board level solder joint failures; brass heat spreader; dynamic load testing; failure analysis; failure mechanisms; failure patterns; heat-spreader mass inertia; quasi-static bend tests; solder interconnection reliability; static load testing; surface mounted MCM; Accelerometers; Capacitive sensors; Circuit testing; Electronic equipment testing; Failure analysis; Laboratories; Mechanical engineering; Packaging; Soldering; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
  • Print_ISBN
    0-7803-8205-6
  • Type

    conf

  • DOI
    10.1109/EPTC.2003.1271523
  • Filename
    1271523