Title :
Analysis of reflectarrays printed above variable substrate thicknesses
Author :
Inam, M. ; Ismail, M.Y. ; Zain, A.F.M. ; Mughal, M.A.
Author_Institution :
Wireless & Radio Sci. Centre (WARAS), Univ. Tun Hussein Onn Malaysia (UTHM), Batu Pahat, Malaysia
Abstract :
This paper presents a thorough investigation of the effects of substrate thickness on the performance of infinite reflectarrays. The reflectarrays designed in the X-band frequency range are investigated in terms of electric field intensity, reflection loss and reflection phase performance. It has been demonstrated that the electric field intensity decreases from 3.42e5V/m to 2.34e5V/m as the thickness of the substrate is increased from 0.2mm to 2.0mm. The measured reflection loss has been shown to decrease from 15dB to 2.25dB as the substrate thickness is changed from 0.127mm to 0.381mm. Furthermore the effect of substrate thickness on the reflection phase performance has also been demonstrated by waveguide scattering parameter measurements.
Keywords :
S-parameters; microstrip antenna arrays; microwave antenna arrays; reflector antennas; X-band; electric field intensity; infinite reflectarrays; loss 15 dB; loss 2.25 dB; patch element; reflection loss; reflection phase performance; size 0.127 mm; size 0.2 mm to 2.0 mm; size 0.381 mm; variable substrate thickness; waveguide scattering parameter; Bandwidth; Loss measurement; Phase measurement; Reflection; Reflector antennas; Substrates; Thickness measurement; Bandwidth; Reflectarray; Reflection loss; Reflection phase; Substrate thickness;
Conference_Titel :
Applied Electromagnetics (APACE), 2010 IEEE Asia-Pacific Conference on
Conference_Location :
Port Dickson
Print_ISBN :
978-1-4244-8565-9
DOI :
10.1109/APACE.2010.5720081
