DocumentCode
2607695
Title
Testing for Reliability Qualification of Semiconductor Memory Devices
Author
Brown, J. Reese, Jr.
Author_Institution
Burroughs Corporation, Piscataway, New Jersey 08854
fYear
1978
fDate
28581
Firstpage
79
Lastpage
80
Abstract
This presentation describes the essence of the reliability qualification program and procedures which have evolved since we first started designing semiconductor memory systems in 1970. The goal for the program is to determine and maintain the reliability of the semiconductor memory devices and systems over their whole life.
Keywords
Condition monitoring; Life testing; Moisture; Performance evaluation; Qualifications; Semiconductor device reliability; Semiconductor device testing; Semiconductor memory; System testing; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location
San Diego, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1978.362824
Filename
4208214
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