Title :
Testing for Reliability Qualification of Semiconductor Memory Devices
Author :
Brown, J. Reese, Jr.
Author_Institution :
Burroughs Corporation, Piscataway, New Jersey 08854
Abstract :
This presentation describes the essence of the reliability qualification program and procedures which have evolved since we first started designing semiconductor memory systems in 1970. The goal for the program is to determine and maintain the reliability of the semiconductor memory devices and systems over their whole life.
Keywords :
Condition monitoring; Life testing; Moisture; Performance evaluation; Qualifications; Semiconductor device reliability; Semiconductor device testing; Semiconductor memory; System testing; Temperature;
Conference_Titel :
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/IRPS.1978.362824
