DocumentCode :
2607712
Title :
Process Testing for Reliability Control
Author :
Schroen, Walter H.
Author_Institution :
Texas Instruments Incorporated, Dallas, Texas 75265. 214-238-2862
fYear :
1978
fDate :
28581
Firstpage :
81
Lastpage :
87
Keywords :
Circuit testing; Failure analysis; Integrated circuit reliability; Integrated circuit testing; Life estimation; Life testing; Microprocessors; Process control; Stress; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location :
San Diego, CA, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1978.362825
Filename :
4208215
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2607712
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