DocumentCode :
2607801
Title :
Models to calculate safety and reliability parameters for embedded systems
Author :
Börcsök, J.
Author_Institution :
Comput. Archit. & Syst. Programming, Univ. of Kassel, Kassel, Germany
fYear :
2009
fDate :
29-31 Oct. 2009
Firstpage :
1
Lastpage :
8
Abstract :
This paper intends to demonstrate that embedded systems have to fulfil high safety and reliability requirements if they are implemented in safety loops. It describes reliability and safety methods especially for the SIL classification of hardware components. Mathematical equations determine safety parameters using the Weibull distribution. Further two types of models are demonstrated: safety architectures with and without redundancy. Since the industrial experience has shown that special architectures such as 1oo1, 1oo2 or 2oo4 are necessary, relevant equations are shown in this paper. Safety considerations must take into account both hardware and software. The measures required for the SIL classification will also be shown in this paper.
Keywords :
Weibull distribution; embedded systems; redundancy; software reliability; 1oo1 architecture; 1oo2 architecture; 2oo4 architecture; SIL classification; Weibull distribution; embedded system; hardware component; industrial experience; mathematical equation; redundancy; reliability parameter; safety loop; safety parameter; Computer architecture; Embedded system; Equations; Hardware; IEC standards; Railway engineering; Railway safety; Reliability engineering; Software safety; Weibull distribution; 1oo1; 1oo2; 2oo4; SIL; Weibull distribution; component; embedded systems; reliability; safety; safety architecture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information, Communication and Automation Technologies, 2009. ICAT 2009. XXII International Symposium on
Conference_Location :
Bosnia
Print_ISBN :
978-1-4244-4220-1
Electronic_ISBN :
978-1-4244-4221-8
Type :
conf
DOI :
10.1109/ICAT.2009.5348443
Filename :
5348443
Link To Document :
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