DocumentCode :
2607901
Title :
A strain gauge that uses carbon black and carbon nanotube doped silicone oil encapsulated in a PDMS microchannel
Author :
Cheng, Ching-Hsiang ; Xiao, Lidan ; Cheung, Yin-Nee ; Chao, Chen ; Yang, Mo ; Kwok, King-Lun ; Chong, Po-Fat ; Leung, Wallace
Author_Institution :
Res. Inst. of Innovative Products & Technol., Hong Kong Polytech. Univ., Hong Kong
fYear :
2007
fDate :
2-5 Aug. 2007
Firstpage :
1199
Lastpage :
1202
Abstract :
We present a piezoresistive strain gauge fabricated using electrically conductive silicone oil encapsulated in a close volume polydimethylsiloxane (PDMS) microchannel. The conductive silicone oil is made using carbon black and carbon nanotube to dope the silicone oil to become conductive. A characteristic of the electrical resistance versus the applied pulling force was measured. The non-linear behavior was due to the large deformation of the strain gauge, which makes the second order term of the increasing gauge length can not be ignored. An exponentially decrease of the resistance was found when applying a biasing voltage without exerting a force. It is caused by the reorganization of the carbon black particles in the silicone oil with applying electrical field. Temperature change also gave effect on the strain gauge with positive and negative temperature coefficients (PTC and NTC) with turning point at 55degC.
Keywords :
carbon nanotubes; deformation; encapsulation; microchannel flow; silicone insulation; strain gauges; C; PDMS microchannel; carbon black; carbon nanotube; deformation; electrical resistance; electrically conductive silicone oil; encapsulation; piezoresistive strain gauge; polydimethylsiloxane microchannel; Capacitive sensors; Carbon nanotubes; Electric resistance; Electric variables measurement; Electrical resistance measurement; Force measurement; Microchannel; Petroleum; Piezoresistance; Temperature; Carbon Black; Carbon Nanotube; Microchannel; PDMS; Silicone Oil; Strain Gauge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-0607-4
Electronic_ISBN :
978-1-4244-0608-1
Type :
conf
DOI :
10.1109/NANO.2007.4601398
Filename :
4601398
Link To Document :
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