DocumentCode
2607974
Title
Electrical Degradation Study of Machine Winding Insulation
Author
Grzybowski, S. ; Taylor, C.D. ; Chalise, S.R.
Author_Institution
Dept. of Electr. & Comput. Eng., Mississippi State Univ., MS, USA
fYear
2008
fDate
9-12 Nov. 2008
Firstpage
321
Lastpage
325
Abstract
Modern electrical machines must be designed as rugged and flexible. The use of power electronic devices cause voltage spikes and introduce harmonics that electrically degrade the insulation of the windings in the machines. High frequency power electronic driver circuits also increase the operating temperatures, which affect the aging and breakdown properties of the machine winding insulation. High frequency pulse voltages can be used to study the impact of electrical degradation of the machine winding insulation that exists in electrical machines. Insulation materials are tested at 90% rated temperature for the material. Evaluation of the change in dielectric strength is monitored versus the aging caused by the high frequency pulse voltage. In many high voltage systems, breakdown voltage is an indication of insulation condition. Partial discharge presents issues in electromagnetic compatibility as a noise source. Therefore, breakdown test and partial discharge inception/extinction voltage test at 60 Hz is performed on the twisted wire samples.
Keywords
driver circuits; electric breakdown; electric machines; electromagnetic compatibility; machine insulation; machine windings; partial discharges; power electronics; breakdown voltage; dielectric strength; electrical degradation; electrical machines; electromagnetic compatibility; extinction voltage test; frequency 60 Hz; high frequency power electronic driver circuits; high frequency pulse voltages; machine winding insulation; operating temperatures; partial discharge inception; power electronic devices; voltage spikes; Aging; Breakdown voltage; Degradation; Dielectric materials; Dielectrics and electrical insulation; Frequency; Machine windings; Partial discharges; Power electronics; Temperature; Accelerated degradation; aging; breakdown voltage; partial discharge; wire insulation;
fLanguage
English
Publisher
ieee
Conference_Titel
High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
Conference_Location
Chongqing
Print_ISBN
978-1-4244-3823-5
Electronic_ISBN
978-1-4244-2810-6
Type
conf
DOI
10.1109/ICHVE.2008.4773938
Filename
4773938
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