DocumentCode
2608134
Title
Correlating Digital Measurements of Electrical Quantities and Related Images on Micro Discharges under High Voltages
Author
Cardoso, José A A ; Filho, Orsino Oliveira ; Levy, Alain F S
Author_Institution
CEPEL - Electr. Power Res. Center, Nova Iguacu
fYear
2008
fDate
9-12 Nov. 2008
Firstpage
355
Lastpage
358
Abstract
Relatively new tools such as digital systems for measuring and analyzing partial discharge (PD) quantities and radio-interference voltage (RIV) levels, UV cameras, besides high resolution digital scopes, have been available in the market. Some of them have not been considered in the relevant standards yet. In order to correlate some results obtained with the application of these tools to quantify and observe an electrical phenomenon such as PD, an experimental work was done in a test set up using different test cells under high voltages (HV). Two types of test cells with different gap arrangements in air were built: one with an ordinary needle to plane gap and other with a floating electrode. The cells were energized under AC voltages from 3 to 20 kV. At each voltage level, measurements were done using digital measuring systems for PD, RIV and electric current. Additionally, common digital pictures and movies recorded by a UV camera were performed focusing the cell discharge region. The results showed consistent correlations within the same family of results. The day light UV camera was able to capture detailed dynamic images without any change in the indoor ambient light.
Keywords
air gaps; electric variables measurement; partial discharge measurement; ultraviolet detectors; UV cameras; air gap arrangements; common digital pictures; digital measurements; dynamic images; electric current; electrical quantity; high voltages; microdischarges; partial discharge quantity; radio-interference voltage levels; voltage 3 kV to 20 kV; Current measurement; Digital cameras; Digital systems; Electric variables measurement; Electrodes; Needles; Partial discharge measurement; Partial discharges; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
Conference_Location
Chongqing
Print_ISBN
978-1-4244-3823-5
Electronic_ISBN
978-1-4244-2810-6
Type
conf
DOI
10.1109/ICHVE.2008.4773946
Filename
4773946
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