DocumentCode

2608161

Title

Degradation of PVF2 Capacitors During Accelerated Tests

Author

Burough, J.W. ; Brammer, W.G. ; Burnham, John

Author_Institution

Hughes Aircraft Company, Technical Services Division, Culver City, CA 90230. (213) 391-0711

fYear

1978

fDate

28581

Firstpage

219

Lastpage

223

Keywords

Capacitance; Capacitors; Degradation; Electrical resistance measurement; Electrodes; Insulation; Life estimation; Life testing; Metallization; Optical films;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1978. 16th Annual

Conference_Location

San Diego, CA, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1978.362849

Filename

4208239